ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,827, issued on Aug. 25, was assigned to Renascent Diagnostics LLC (Burlington, Vt.). "System and method for detecting a target bacteria" wa... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,828, issued on Aug. 25, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan). "Signal processing method, signal processing device, a... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,829, issued on Aug. 25, was assigned to Max-Planck-Gesellschaft zur Forderung der Wissenschaften e.V. (Berlin). "Method for mapping the sur... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,830, issued on Aug. 25, was assigned to PBT Works s.r.o. (Roznov pod Radhostem, Czech Republic). "Equipment for measuring the content of or... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,831, issued on Aug. 25, was assigned to Sony Semiconductor Solutions Corp. (Kanagawa, Japan). "Photodetection device and electronic device"... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,832, issued on Aug. 25, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Non-destructive inspection method including ... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,834, issued on Aug. 25, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Optimized mirror-based light focusing for optical se... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,835, issued on Aug. 25, was assigned to Chevron U.S.A. Inc. (San Ramon, Calif.). "Spectroscopic analysis of rocks" was invented by Kenneth ... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,837, issued on Aug. 25, was assigned to KLA Corp. (Milpitas, Calif.). "Scanning diffraction based overlay scatterometry" was invented by It... Read More
ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,838, issued on Aug. 25, was assigned to AMS-OSRAM INTERNATIONAL GMBH (Regensburg, Germany). "Optoelectronic device and a method for determi... Read More